硅基芯片及模組系列
第三代半導(dǎo)體芯片及模組系列
| Rel item | Full name | Reference | Conditions | Read-out |
|---|---|---|---|---|
| HTRB | High Temperature Reverse Bias Test | JESD22-A108 | Tj=Tvjmax，VCE=80%VCEmax，VGE=0V | 1000h |
| HTGB | High Temperature Gate Bias Test | JESD22-A108 | Tj=Tv jmax，VCE=0V，VGE=VGEmax | 1000h |
| H3TRB | High Humidity High Temperature Reverse Bias | JESD22-A110 | Ta=85°C，RH=85%，VCE=80%VCEmax up to 100V，VGE=0V | 1000h |
| IOL | Intermittent Operational Life | MIL-STD-750 | ton=5min，toff=5min, △Tj=100°C,Tjmax=Tvjmax3000cycles | / |
| TC | Temperature Cycle | JESD22-A104 | 55°Cto 150°C,Dwell≥15min,1000cycles | / |
車(chē)規(guī)應(yīng)用產(chǎn)品摸底考核標(biāo)準(zhǔn)（模塊）
| Rel item | Full name | Reference | Conditions | Read-out |
|---|---|---|---|---|
| HTRB | High Temperature Reverse Bias Test | XCZ-QW-PE-02 | Tj= Tjmax in datasheet， Vds = 80% BV rating，VGE=0V | 168hr 500hr 1000hr |
| HTGB | High Temperature Gate Bias Test | GB/T 29332-2012 | Tj= Tjmax in datasheet，Vge= 100% VGS rating，VCE=0V | 168hr 500hr 1000hr |
| H3TRB | High Humidity High Temperature Reverse Bias | JESD22-A110 | Ta=85℃，85%RH，VCE =80V | 168hr 500hr 1000hr |
| TC | Temperature Cycle | JESD22-A104 | -40℃/30min~125℃/30min，1000cycle | 168hr 500hr 1000hr |
| PCsec | Power Cycle second | IEC 60749-34:2011 AQG-324 | ΔTj=100℃，Tvjmax=150℃，ton/toff=5sec/5sec 50000 cycles | 50000 cycles |
| PCmin | Power Cycle minutes | IEC 60749-34:2011 AQG-324 | Tvj=Tvjopmax，Iload>=0.85Irate，ΔTc=100℃ Ton<=1.5min，Toff<=4.5min，20000 cycles | 20000 cycles |
| MV | Vibration | IEC 60068-2-6 | 1. sinusoidal vibration(6G): 100Hz , 30m/s2 200Hz , 60m/s2 440Hz , 60m/s2 2. wide-band ramdom vibration(10G): 10Hz - 2000Hz, 96.6m/s2 3. 22h for each spatial axis | 22h for each spatial axis |
芯長(zhǎng)征始終重視客戶意見(jiàn)，承諾為所有中國(guó)區(qū)客戶提供快速、優(yōu)質(zhì)的售后服務(wù)。我們保證客戶意見(jiàn)的反饋渠道通暢、專用；我們保證24h時(shí)效的意見(jiàn)評(píng)估和反饋，同時(shí)協(xié)調(diào)研發(fā)團(tuán)隊(duì)充分支持客戶需求；我們保證特定質(zhì)量控制流程以處理產(chǎn)品質(zhì)量問(wèn)題。芯長(zhǎng)征堅(jiān)持傾聽(tīng)客戶的聲音，以優(yōu)質(zhì)的服務(wù)滿足客戶多樣化需求。
